SpectraLab offers innovative solutions and constantly updated techniques and methodologies.

This is possible thanks to the access to specialized university laboratories.

OPTICAL MICROSCOPY

The optical microscope, in both reflected and transmitted polarized light, is used for mineralogical and petrographic observations, in the field of gemology and in the characterization of materials of industrial interest. Our microscopes are equipped with a HD digital camera that allows to acquire photomicrographs.

SCANNING ELECTRON MICROSCOPE & ENERGY DISPERSION MICROPROBE (SEM-EDS)

SEM-EDS is the ideal tool for morphological and chemical investigations on samples of rocks, minerals, fossils and materials of geological, technological, industrial and biological interest. This device also offers the possibility of working with variable pressure, making it a very versatile and non-destructive technique.

RAMAN SPECTROSCOPY 

Raman spectroscopy is a non-destructive technique that allows the identification of solid, liquid and gaseous materials, both organic and inorganic. Among the main applications: characterization of minerals, gems and inclusions.

X-RAY DIFFRACTION FOR POWDERS AND SINGLE CRYSTALS 

X-ray diffraction gives qualitative and quantitative information, it is suitable for every kind of crystalline phases (both natural or synthetic). The wide range of applications makes it a fundamental tool for materials analysis.

ICP-OES

Through the application of Optical Emission Spectrometry it is possible to quantify the concentration of minor and trace elements in a sample. 
It is used in different fields including geology, chemistry, medicine, metallurgy.

SCANNING PROBE MICROSCOPY 

This technique offers the chance to acquire three-dimensional topographic images of materials, it is suitable for in-situ and ex-situ study of surfaces (observing features such as roughness and microstructures) and for the analysis of surface-solution interactions.